Title :
Contribution to electrical fast transient/burst modelling
Author :
Stéphane, Laik ; Jean-Louis, Boizard
Author_Institution :
Univ. Paul Sabatier, Toulouse, France
Abstract :
In order to determine the instability of any electronic device during the design process, electrical fast transients/burst (EFT/B) may be applied successively on the main power and input/output (I/O) ports. This non-destructive test points out several errors in the design. Protection against this disturbance on the power supply ports of the device may be defined rather easily. However concerning the I/O ports, the task becomes tougher. This paper describes a study of the parasitic currents and voltages generated on the I/O ports undergoing EFT/B through a standardized capacitive coupling clamp (standard IEC 61000-4-4) in order to find an equivalent Thevenin´s generator of the association: the EFT/B generator/capacitive coupling clamp
Keywords :
IEC standards; capacitance; electric impedance; electromagnetic compatibility; electronic equipment testing; equivalent circuits; measurement errors; measurement standards; probes; stability; transients; voltage measurement; EFT/B generator/capacitive coupling clamp; EMC directive; EMC standards; FFT based algorithm; I/O ports; design errors; electrical fast transient/burst modelling; electronic device instability; equivalent Thevenin´s generator; input/output ports; mains power; nondestructive test; parasitic currents; parasitic voltages; power supply ports; standard IEC 61000-4-4; standardized capacitive coupling clamp; voltage probes; Capacitors; Clamps; DC generators; Frequency response; IEC standards; Impedance; Probes; Process design; Testing; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812966
