DocumentCode :
3423880
Title :
Molecular dynamics simulation and mechanical characterisation for the establishment of structure-property correlations for epoxy resins in microelectronics packaging applications
Author :
Wunderle, B. ; Dermitzaki, E. ; Holck, O. ; Bauer, J. ; Walter, H. ; Shaik, Q. ; Ratzke, K. ; Faupe, F. ; Michel, B.
Author_Institution :
Fraunhofer Inst. Zuverlassigkeit und Mikrointegration, Berlin
fYear :
2009
fDate :
26-29 April 2009
Firstpage :
1
Lastpage :
11
Abstract :
In this paper the potential of molecular dynamics simulation for structure-property correlations in epoxy-resins is discussed. This is a topic relevant for a multi-scale framework to lifetime prediction in microelectronics packaging. To achieve that objective, epoxy-resins are synthesised by systematically varying their chemical structure and then characterised by various thermo-mechanical testing methods. It was found that moisture diffusion showed the most distinct response with respect to material and loading parameters such as polarity, free volume, crosslinking density, moisture concentration and temperature. Starting with a parametric study, modeling approaches of different complexity have been able to show qualitative and quantitative agreement respectively. The paper comments further on the accuracy and limits of the method and correlates the calculations with experimental structural analysis results.
Keywords :
integrated circuit packaging; molecular dynamics method; polymers; structural engineering; crosslinking density; epoxy resins; mechanical characterisation; microelectronics packaging applications; moisture concentration; molecular dynamics simulation; structural analysis; structure-property correlations; thermo-mechanical testing methods; Conducting materials; Epoxy resins; Materials reliability; Mechanical factors; Microelectronics; Moisture; Packaging; Polymers; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location :
Delft
Print_ISBN :
978-1-4244-4160-0
Electronic_ISBN :
978-1-4244-4161-7
Type :
conf
DOI :
10.1109/ESIME.2009.4938455
Filename :
4938455
Link To Document :
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