DocumentCode :
3424068
Title :
Constitutive behaviour of copper ribbons used in solar cell assembly processes
Author :
Wiese, Steffen ; Meier, Rico ; Kraemer, Frank ; Bagdahn, Joerg
Author_Institution :
Fraunhofer Center, Silicon Photovoltaics, Halle
fYear :
2009
fDate :
26-29 April 2009
Firstpage :
1
Lastpage :
8
Abstract :
One of the driving factors for a steady reduction in wafer and cell thickness is the present shortage of polysilicon feedstock combined with the need to reduce manufacturing costs in photovoltaic module production. Therefore materials and manufacturing processes must adapt to maintain acceptable mechanical yields and module reliability. The soldering of solar cell strings is a critical step in the production of photovoltaic modules. Mechanical load and temperature induced stresses can cause cracking in the cells. During the soldering operation, the cell and the wires heat up and expand and then later contract when the heat is removed below the melting point of the solder. The differential contraction between the Cu and the Si combined with thermal gradients, cause stress to build up in the system. Since the solder thickness (5hellip20 mum) is relatively small compared to thickness of the copper ribbon (100hellip200 mum) and the thickness of the silicon solar cell (160hellip200 mum), the constitutive behaviour of the copper ribbons is one of the key factors to reduce breakage after soldering of solar cells into strings.
Keywords :
assembling; copper; cracks; electrical products industry; fracture; reliability; solar cells; soldering; stress analysis; breakage; copper ribbons; cracking; driving factors; manufacturing processes; mechanical yields; module reliability; photovoltaic module production; polysilicon feedstock; solar cell assembly processes; solar cell strings; soldering operation; temperature induced stresses; thermal gradients; Assembly; Copper; Costs; Manufacturing; Photovoltaic cells; Photovoltaic systems; Production; Solar power generation; Soldering; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location :
Delft
Print_ISBN :
978-1-4244-4160-0
Electronic_ISBN :
978-1-4244-4161-7
Type :
conf
DOI :
10.1109/ESIME.2009.4938464
Filename :
4938464
Link To Document :
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