Title :
Large-Scale Image Annotation by Efficient and Robust Kernel Metric Learning
Author :
Zheyun Feng ; Rong Jin ; Jain, Abhishek
Author_Institution :
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
One of the key challenges in search-based image annotation models is to define an appropriate similarity measure between images. Many kernel distance metric learning (KML) algorithms have been developed in order to capture the nonlinear relationships between visual features and semantics of the images. One fundamental limitation in applying KML to image annotation is that it requires converting image annotations into binary constraints, leading to a significant information loss. In addition, most KML algorithms suffer from high computational cost due to the requirement that the learned matrix has to be positive semi-definitive (PSD). In this paper, we propose a robust kernel metric learning (RKML) algorithm based on the regression technique that is able to directly utilize image annotations. The proposed method is also computationally more efficient because PSD property is automatically ensured by regression. We provide the theoretical guarantee for the proposed algorithm, and verify its efficiency and effectiveness for image annotation by comparing it to state-of-the-art approaches for both distance metric learning and image annotation.
Keywords :
feature extraction; regression analysis; PSD matrix; PSD property; RKML algorithm; binary constraints; image semantics; information loss; kernel distance metric learning algorithm; kernel metric learning efficiency; large-scale image annotation; positive semidefinitive matrix; regression technique; robust kernel metric learning; search-based image annotation model; similarity measure; visual features; Algorithm design and analysis; Approximation algorithms; Approximation methods; Kernel; Measurement; Semantics; Training; Efficient; Image Annotation; Kernel Metric Learning; Regression; Theoretical guarantee;
Conference_Titel :
Computer Vision (ICCV), 2013 IEEE International Conference on
Conference_Location :
Sydney, NSW
DOI :
10.1109/ICCV.2013.203