• DocumentCode
    342450
  • Title

    A neuron-MOS parallel associator for high-speed CDMA matched filter

  • Author

    Okada, Atsuhiko ; Shibata, Tadashi

  • Author_Institution
    Dept. of Inf. & Commun. Eng., Tokyo Univ., Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    392
  • Abstract
    Neuron MOS (νMOS) technology has been applied to build a matched filter for CDMA. Based on the parallel search architecture of νMOS associator, an input signal train captured by sample and hold circuits is simultaneously matched with a group of templates having all possible shifts in phase of an identical PN (pseudorandom noise) code. The maximum correlation is detected by fully parallel comparison using the binary-search νMOS winner-take-all circuit. Such a parallel architecture enables us to perform very fast peak detection as well as the detection of second and third correlation peaks arising from multipath delays. Moreover, the binary-search WTA provides the degree of matching in a binary code, thus enabling more advanced applications. For instance, it is possible to cascade the system in multiple stages and apply it to much longer-chip-length PN codes. Test chips were fabricated in a 0.6-μm double-poly triple-metal CMOS technology and the fundamental operation of the system has been experimentally demonstrated
  • Keywords
    CMOS analogue integrated circuits; analogue processing circuits; code division multiple access; delays; high-speed integrated circuits; matched filters; neural chips; sample and hold circuits; 0.6 micron; binary-search νMOS winner-take-all circuit; double-poly triple-metal CMOS technology; fully parallel comparison; high-speed CDMA matched filter; input signal train; longer-chip-length PN codes; multipath delays; neuron-MOS parallel associator; parallel search architecture; peak detection; pseudorandom noise code; sample and hold circuits; Binary codes; CMOS technology; Circuit noise; Delay; Matched filters; Multiaccess communication; Neurons; Parallel architectures; Phase noise; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.780741
  • Filename
    780741