Title :
A floating-gate technology for digital CMOS processes
Author :
Minch, Bradley A. ; Hasler, Paul
Author_Institution :
Cornell Univ., Ithaca, NY, USA
Abstract :
We discuss the possibility of developing high-quality floating-gate memories and circuits in digital CMOS technologies that have only one layer of polysilicon. Here, the primary concern is whether or not we can get adequate control-gate linearity from MOS capacitors. We employ two experimental procedures to address this issue and find acceptable floating-gate circuit behaviour with MOS capacitors. First, we simultaneously characterize an MOS capacitor and a linear capacitor; the experimental data show that MOS capacitors behave similarly to linear capacitors over a finite, but usable range. Second, we characterize two typical floating-gate MOS circuit primitives, a floating-gate amplifier and a multiple-input translinear element, two basic circuits that rely heavily on the linearity of the capacitors that couple into the floating gates. Our measurements show that floating-gate circuits with MOS-capacitor control gates behave like their counterparts built with linear capacitors over specific regions of operation
Keywords :
CMOS digital integrated circuits; MOS capacitors; elemental semiconductors; silicon; MOS capacitors; control-gate linearity; digital CMOS processes; floating-gate amplifier; floating-gate technology; multiple-input translinear element; single polysilicon layer; CMOS process; CMOS technology; Capacitance measurement; Capacitance-voltage characteristics; Integrated circuit measurements; Linearity; MOS capacitors; Nonvolatile memory; Semiconductor device measurement; Voltage;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.780744