• DocumentCode
    3424531
  • Title

    On the analysis of spontaneous adhesion in MEMS

  • Author

    Ardito, Raffaele ; Corigliano, Alberto ; Frangi, Attilio

  • Author_Institution
    Dept. of Struct. Eng., Piazza Leonardo da Vinci, Milan
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Spontaneous adhesion can seriously jeopardize the reliability of micro-electro-mechanical systems, both during the fabrication phase and in the operation conditions. For this reason, adhesion in MEMS has been the topic of abundant research works in the last decade. This paper aims at the formulation of a computational model in order to simulate the adhesion phenomena in various environmental conditions. The present approach is based on Finite Element (FE) simulations on a representative part of the surface. The micro-scale analyses include the contact behavior of the asperities and the mechanical deformation of the bulk material, which is comparatively modeled as elastic-plastic. The model validation has been based on a simple sphere-on-flat simulation. Some preliminary results are presented with reference to actual rough surfaces.
  • Keywords
    adhesion; deformation; elastoplasticity; finite element analysis; microfabrication; micromechanical devices; reliability; rough surfaces; MEMS; bulk material mechanical deformation; computational model; elastic-plastic material; fabrication phase; finite element simulation; microelectro-mechanical system reliability; microscale analysis; operation condition; rough surface; simple sphere-on-flat simulation; spontaneous adhesion phenomena; Adhesives; Micromechanical devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938487
  • Filename
    4938487