DocumentCode :
3424875
Title :
Modelling of process and reliability of press-fit interconnections
Author :
Fellner, Thomas ; Zukowski, Elena ; Wilde, Jiirgen
Author_Institution :
Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg
fYear :
2009
fDate :
26-29 April 2009
Firstpage :
1
Lastpage :
7
Abstract :
This investigation is aimed at the stability of press-fit interconnections for MID. Moulded interconnect devices (MID) are 3-dimensional substrates produced by thermoplastic injection moulding for large-series applications. The assembly process of press-fit interconnections has been correctly modelled with a FE-Software. With this model the behaviour of the mechanical contact pressure, which decreases due to creep in the thermoplastic base material, could be described. Especially, the modelling is a tool to optimize pin and hole geometries. In order to obtain realistic results, the creep law parameters for the applied base material, a liquid-crystal polymer (LCP), was fitted to experimental. The required coefficients of friction were determined by adapting the simulations to the experiments. The time-dependent retention force between a pin and the substrate directly after assembly or after temperature loads could be predicted with finite element analyses, which was used as reliability criterion.
Keywords :
creep; finite element analysis; friction; injection moulding; interconnections; liquid crystal polymers; mechanical contact; press fitting; reliability; 3D substrates; FE-Software; MID; assembly process; coefficients of friction; creep law parameters; finite element analyses; liquid-crystal polymer; mechanical contact pressure; moulded interconnect devices; press-fit interconnections; reliability criterion; thermoplastic base material; thermoplastic injection moulding; Assembly; Creep; Finite element methods; Friction; Geometry; Injection molding; Liquid crystal polymers; Solid modeling; Stability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location :
Delft
Print_ISBN :
978-1-4244-4160-0
Electronic_ISBN :
978-1-4244-4161-7
Type :
conf
DOI :
10.1109/ESIME.2009.4938502
Filename :
4938502
Link To Document :
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