Statistical analysis of apodized array pattern characteristics under spatially correlated error influence

It is shown that the array pattern parameters under the influence of spatially correlated errors and distortions can and should be optimized in a statistical sense. The proposed sum-type apodization functions (step-like functions also belong to this class) are able to provide the available trade-off of disturbed pattern characteristics. In particular, the mean maximal side lobe level (MSLL) can be reduced by 1.2 dB even in comparison with the optimal Dolph-Chebyshev and Kaiser-Bessel patterns if the initial MSLL is equal. Heuristic recommendations concerning the apodization function selection for a priori known error correlation characteristics and variance are presented