DocumentCode
3425121
Title
Applications of FE multi-scale simulations in microelectronics
Author
van Silfhout, R. ; Viegers, Thijs
Author_Institution
Philips Appl. Technol., Eindhoven
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
1
Abstract
This paper discusses challenges for multi-scale Finite Element (FE) modeling in microelectronics. Its miniaturization and multi-scale nature is an enabler for in Healthcare and Well-being markets. Function integration and miniaturization enable microelectronic products having functionalities such as rollable display (Figure 1), wireless connectivity & GPS, beaming, illumination systems, body health sensor, DNA analyzer, and many many more. For multi-scale FE modeling, their added value could be in preventing reliability problems and enabling faster functionality integrations in microelectronics resulting in shorter time to market and lower cost.
Keywords
finite element analysis; integrated circuit interconnections; integrated circuit reliability; DNA analyzer; FE multiscale simulations; GPS; beaming; body health sensor; finite element modeling; function integration; healthcare markets; illumination systems; microelectronics; miniaturization; rollable display; well-being markets; wireless connectivity; DNA; Displays; Finite element methods; Global Positioning System; Iron; Lighting; Medical services; Microelectronics; Sensor systems; Wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938514
Filename
4938514
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