DocumentCode :
3425185
Title :
An exact analysis for bimolecular band-to-band recombination lifetime under high injection conditions
Author :
Pieper, Ron J. ; Weatherford, Todd
Author_Institution :
Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA
fYear :
1997
fDate :
9-11 Mar 1997
Firstpage :
415
Lastpage :
419
Abstract :
The bimolecular model for predicting transient band-to-band recombination lifetime in semiconductors is nonlinear in the excess carrier concentrations. Usually a low-injection assumption is made which linearizes the problem and yields for direct recombination the well known rule-of-thumb that the excess carrier lifetime should depend inversely on the doping concentration. For applications in which the low-injection assumption is invalid a more precise analysis which produces an injection dependent lifetime is presented
Keywords :
carrier density; carrier lifetime; electron-hole recombination; minority carriers; semiconductor device models; semiconductors; transient analysis; bimolecular band-to-band recombination lifetime; bimolecular model; doping concentration; excess carrier lifetime; high injection conditions; injection dependent lifetime; minority carrier lifetime; semiconductor devices; semiconductors; transient band-to-band recombination lifetime; Charge carrier lifetime; Charge carrier processes; Light emitting diodes; Nonlinear optics; Predictive models; Radiative recombination; Semiconductor device doping; Semiconductor devices; Semiconductor process modeling; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Theory, 1997., Proceedings of the Twenty-Ninth Southeastern Symposium on
Conference_Location :
Cookeville, TN
ISSN :
0094-2898
Print_ISBN :
0-8186-7873-9
Type :
conf
DOI :
10.1109/SSST.1997.581693
Filename :
581693
Link To Document :
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