• DocumentCode
    3425555
  • Title

    Mechanical characteristics of FIB deposited carbon nanowire by electrostatic actuated nano tensile testing devices (EANAT)

  • Author

    Isono, Yoshitada ; Kiuchi, Masaru ; Sugiyama, Susumu ; Morita, Takahiko ; Matsui, Sinji

  • Author_Institution
    Dept. of Micro Syst. Technol., Ritsumeikan Univ., Shiga, Japan
  • fYear
    2005
  • fDate
    30 Jan.-3 Feb. 2005
  • Firstpage
    883
  • Lastpage
    886
  • Abstract
    This research develops Electrostatic Actuated NAno Tensile testing devices, which are named "EANAT" from the initial letter, in order to reveal mechanical properties of carbon nanowires deposited by focused ion beam assisted chemical vapor deposition (FIB-CVD). Nanometric carbon structures deposited by FIB-CVD are one of promising nanomateriais used for NEMS. In this research, mechanical properties of 85 nm-diametric carbon nanowires were evaluated using three types of EANAT containing electrostatic comb drive actuators from 1000 to 5000 pairs. Young\´s modulus of carbon nanowires averaged 80 GPa, which is close to reported values of ultra-thin diamond-like carbon films. The tensile strength of nanowires was also 6 GPa in average.
  • Keywords
    Young´s modulus; chemical vapour deposition; electrostatic actuators; focused ion beam technology; nanowires; tensile testing; EANAT testing device; Electrostatic Actuated NAno Tensile testing device; FIB deposited carbon nanowire; FIB-CVD; Young Modulus; electrostatic comb drive actuators; focused ion beam assisted chemical vapor deposition; mechanical characteristics; nanometric carbon structures; ultra-thin diamond-like carbon films; Chemical technology; Electrostatic actuators; Electrostatic measurements; Fabrication; Ion beams; Mechanical factors; Nanoelectromechanical systems; Nanoscale devices; Nanostructures; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-8732-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2005.1454071
  • Filename
    1454071