DocumentCode :
3425788
Title :
An embedded variable bit-rate coder based on GSM EFR: EFR-EV
Author :
Jung, Sung-Kyo ; Ragot, Stéphane ; Lamblin, Claude ; Proust, Stéphane
Author_Institution :
France Telecom R&D/TECH/SSTP, Lannion
fYear :
2008
fDate :
March 31 2008-April 4 2008
Firstpage :
4765
Lastpage :
4768
Abstract :
This paper describes a 12.2-32 kbps scalable wideband speech and audio coder interoperable with GSM enhanced full-rate (EFR). This coder, referred to as EFR-EV, is designed using the ITU-T G.729.1 multi-stage coding structure. Specifically, EFR-EV consists of three stages: a code-excited linear prediction (CELP) stage derived from EFR, time-domain bandwidth extension (TDBWE), and time-domain aliasing cancellation (TDAC). In this paper, we show that the G.729.1 extension layers (i.e. TDBWE and TDAC) are quite generic for scalable codec design in the sense that they can be applied to EFR with limited adjustments. In addition, we propose a minor modification of the bit allocation procedure in TDAC stage, exploiting spectral masking only for higher frequency bands. The performance of EFR- EV and G.729.1 are evaluated in terms of objective/subjective quality, algorithmic delay, and complexity.
Keywords :
audio coding; linear predictive coding; speech codecs; speech coding; time-domain analysis; variable rate codes; EFR-EV; G.729.1 extension layers; GSM EFR; GSM enhanced full-rate; ITU-T G.729.1 multistage coding; algorithmic delay; audio coder; bit allocation; code-excited linear prediction; complexity; embedded variable bit rate coder; objective quality; scalable codec design; scalable wideband speech; spectral masking; subjective quality; time-domain aliasing cancellation; time-domain bandwidth extension; Bit rate; Code standards; Codecs; Costs; GSM; Niobium; Signal generators; Speech; Time domain analysis; Wideband; EFR-EV; G.729.1; GSM EFR; Scalable wideband coder; embedded coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1520-6149
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2008.4518722
Filename :
4518722
Link To Document :
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