• DocumentCode
    3426252
  • Title

    Bi-objective model for test-suite reduction based on modified condition/decision coverage

  • Author

    Pan, Lili ; Zou, Beiji ; Li, Junyi ; Chen, Hao

  • Author_Institution
    Sch. of Comput. & Commun., Hunan Univ., China
  • fYear
    2005
  • fDate
    12-14 Dec. 2005
  • Abstract
    It is evidence that modified condition/decision coverage (MC/DC) is an effective verification method and can help to detect safety faults despite of its expensive cost. In regression testing, it is quite costly to rerun all of test cases in test suite because new test cases are added to test suite as the software evolves. Therefore, it is necessary to reduce the test suite to improve test efficiency and save test cost. Many existing test-suite reduction techniques are not effective to reduce MC/DC test suite. This paper proposes a new test-suite reduction technique for MC/DC: a bi-objective model that considers both the coverage degree of test case for test requirements and the capability of test cases to reveal error. Our experiment results show that the technique both reduces the size of test suite and better ensures the effectiveness of test suite to reveal error.
  • Keywords
    program testing; program verification; biobjective model; condition/decision coverage; formal verification; regression testing; safety fault detection; software testing; test-suite reduction; Computer industry; Costs; Educational institutions; Fault detection; Information science; Software safety; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2005. Proceedings. 11th Pacific Rim International Symposium on
  • Print_ISBN
    0-7695-2492-3
  • Type

    conf

  • DOI
    10.1109/PRDC.2005.22
  • Filename
    1607520