DocumentCode :
3426467
Title :
Colored Petri nets for the performance evaluation of a semiconductor fabrication facility
Author :
Zimmermann, Armin ; Westphal, H. ; Gramlich, Stephan
Author_Institution :
Tech. Univ. Berlin, Germany
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
1071
Abstract :
The design, implementation, and operation of modern manufacturing systems is a complex task. Without powerful modeling and performance evaluation techniques it is practically impossible to efficiently design a manufacturing system. In the paper the application of Petri net modeling and analysis techniques is demonstrated using a real-life industrial example from the semiconductor fabrication field. It is shown how the performance can be evaluated and, using the results, system parameters are adjusted for an efficient production. A hierarchical colored model of the application example is presented. The detailed models of identical failing machines are aggregated to reduce the computational effort of the performance evaluation. Using the industrial example as a case study, the paper aims at presenting some theoretical methods and their application using a software tool during the design of manufacturing systems
Keywords :
CAD; Petri nets; graph colouring; integrated circuit manufacture; production engineering computing; colored Petri nets; hierarchical colored model; identical failing machines; modern manufacturing systems; performance evaluation; semiconductor fabrication facility; Application software; Computer industry; Fabrication; Machinery production industries; Manufacturing industries; Manufacturing systems; Petri nets; Power system modeling; Production systems; Textile industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference on
Conference_Location :
Barcelona
Print_ISBN :
0-7803-5670-5
Type :
conf
DOI :
10.1109/ETFA.1999.813109
Filename :
813109
Link To Document :
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