• DocumentCode
    3426467
  • Title

    Colored Petri nets for the performance evaluation of a semiconductor fabrication facility

  • Author

    Zimmermann, Armin ; Westphal, H. ; Gramlich, Stephan

  • Author_Institution
    Tech. Univ. Berlin, Germany
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1071
  • Abstract
    The design, implementation, and operation of modern manufacturing systems is a complex task. Without powerful modeling and performance evaluation techniques it is practically impossible to efficiently design a manufacturing system. In the paper the application of Petri net modeling and analysis techniques is demonstrated using a real-life industrial example from the semiconductor fabrication field. It is shown how the performance can be evaluated and, using the results, system parameters are adjusted for an efficient production. A hierarchical colored model of the application example is presented. The detailed models of identical failing machines are aggregated to reduce the computational effort of the performance evaluation. Using the industrial example as a case study, the paper aims at presenting some theoretical methods and their application using a software tool during the design of manufacturing systems
  • Keywords
    CAD; Petri nets; graph colouring; integrated circuit manufacture; production engineering computing; colored Petri nets; hierarchical colored model; identical failing machines; modern manufacturing systems; performance evaluation; semiconductor fabrication facility; Application software; Computer industry; Fabrication; Machinery production industries; Manufacturing industries; Manufacturing systems; Petri nets; Power system modeling; Production systems; Textile industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference on
  • Conference_Location
    Barcelona
  • Print_ISBN
    0-7803-5670-5
  • Type

    conf

  • DOI
    10.1109/ETFA.1999.813109
  • Filename
    813109