Title :
On ILP formulations for built-in self-testable data path synthesis
Author :
Kim, Han Bin ; Ha, Dong Sam ; Takahashi, Takeshi
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
In this paper, we present a new method for the built-in self-testable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, built-in self-test (BIST) register assignment, and interconnection assignment concurrently to yield optimal designs. Our experimental results show that our method successfully synthesizes BIST circuits for all six circuits experimented on. All the BIST circuits are better in area overhead than those generated by existing high-level BIST synthesis methods
Keywords :
built-in self test; circuit optimisation; design for testability; high level synthesis; integer programming; integrated circuit interconnections; integrated circuit testing; linear programming; BIST register assignment; ILP formulations; area overhead; built-in self-testable data path synthesis; integer linear programming; interconnection assignment; optimal designs; system register assignment; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; High level synthesis; Integer linear programming; Integrated circuit interconnections; Permission; Registers; Scheduling;
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
DOI :
10.1109/DAC.1999.782111
