• DocumentCode
    3427207
  • Title

    Glass direct bonding technology for hermetic seal package

  • Author

    Ando, Daizo ; Oishi, Kunihiko ; Nakamura, Tadash ; Umeda, Sinji

  • Author_Institution
    Corporate Components Dev. Centre, Matsushita Electron. Components Co. Ltd., Osaka, Japan
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    186
  • Lastpage
    190
  • Abstract
    A new SMD type hermetic seal package using glass wafers has been developed for SAW (surface acoustic wave) resonators. This package is composed of two glass wafers in which many cavities and through holes are formed. The SAW resonator chip is inserted into the cavity. Electrodes are led out from the through holes without using wire. Two glass wafers are directly bonded at the atomic level using no adhesive. This package technology realizes small size, low profile SMD type package whose size is the chip size plus 1.0 mm and whose height is 1.0 mm. The size of the glass package type SAW resonator is 4.0×2.0×1.0 mm. The area is 1/9 and the volume is 1/33 of the conventional CAN package. The frequency characteristics and reliability of the developed SAW resonators were checked. No degradation was observed by the packaging process. The insertion loss was reduced by wireless assembly. The change in the characteristics after high-temperature storage test was extremely small because no resin is used in the glass package
  • Keywords
    glass; surface acoustic wave resonators; surface mount technology; wafer bonding; 1 mm; 2 mm; 250 C; 4 mm; CAN package; SAW; SAW resonator chip; adhesive; atomic level; batch process; frequency characteristics; glass direct bonding; glass package; glass wafers; hermetic seal package; high-temperature storage test; insertion loss; reliability; wireless assembly; Acoustic waves; Degradation; Electrodes; Frequency; Glass; Hermetic seals; Packaging; Surface acoustic waves; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581800
  • Filename
    581800