• DocumentCode
    3427257
  • Title

    Microriveting-a new wafer joining method

  • Author

    Shivkumar, Bharat ; Kim, Chang-Jin

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    197
  • Lastpage
    202
  • Abstract
    Microriveting, a new technique to join wafers, is presented as an alternative to wafer bonding. Actual microrivets are fabricated to provide proof-of-concept structures and have been tested to confirm the feasibility of the idea for MEMS packaging. The microrivets of this paper are developed by nickel electroplating. Advantages of this technique include the joining process performed at room temperature and low voltage and relaxed requirements for surface preparation. Wafers of different sizes have been joined together by riveting and did not separate at large (macro) forces applied by rough handling and even by wafer sawing. Failure mechanisms of these rivets are investigated, and measurements are carried out to determine the joining strength under shear and tension. Results show that microriveting is a feasible and economical joining technique to package microdevices
  • Keywords
    electroplating; failure analysis; fracture toughness testing; integrated circuit packaging; mechanical testing; micromachining; micromechanical devices; shear strength; MEMS packaging; Ni electroplating; failure mechanisms; feasibility; joining process; joining strength; low voltage; microriveting; room temperature; shear; surface preparation; tension; wafer sawing; Joining processes; Low voltage; Micromechanical devices; Nickel; Packaging; Rough surfaces; Surface roughness; Temperature; Testing; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581803
  • Filename
    581803