Title :
Microriveting-a new wafer joining method
Author :
Shivkumar, Bharat ; Kim, Chang-Jin
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Microriveting, a new technique to join wafers, is presented as an alternative to wafer bonding. Actual microrivets are fabricated to provide proof-of-concept structures and have been tested to confirm the feasibility of the idea for MEMS packaging. The microrivets of this paper are developed by nickel electroplating. Advantages of this technique include the joining process performed at room temperature and low voltage and relaxed requirements for surface preparation. Wafers of different sizes have been joined together by riveting and did not separate at large (macro) forces applied by rough handling and even by wafer sawing. Failure mechanisms of these rivets are investigated, and measurements are carried out to determine the joining strength under shear and tension. Results show that microriveting is a feasible and economical joining technique to package microdevices
Keywords :
electroplating; failure analysis; fracture toughness testing; integrated circuit packaging; mechanical testing; micromachining; micromechanical devices; shear strength; MEMS packaging; Ni electroplating; failure mechanisms; feasibility; joining process; joining strength; low voltage; microriveting; room temperature; shear; surface preparation; tension; wafer sawing; Joining processes; Low voltage; Micromechanical devices; Nickel; Packaging; Rough surfaces; Surface roughness; Temperature; Testing; Wafer bonding;
Conference_Titel :
Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-3744-1
DOI :
10.1109/MEMSYS.1997.581803