DocumentCode
3427284
Title
A metric between probability distributions on finite sets of different cardinalities
Author
Vidyasagar, M.
Author_Institution
Erik Jonsson Sch. of Eng. & Comput. Sci., Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2011
fDate
12-15 Dec. 2011
Firstpage
710
Lastpage
715
Abstract
With increasing use of digital control it is natural to view control inputs and outputs as stochastic processes assuming values over finite alphabets rather than in a Euclidean space. As control over networks becomes increasingly common, data compression by reducing the size of the input and output alphabets without losing the fidelity of representation becomes relevant. This requires us to define a notion of distance between two stochastic processes assuming values in distinct sets, possibly of different cardinalities. If the two processes are i.i.d., then the problem becomes one of defining a metric between two probability distributions over distinct finite sets of possibly different cardinalities. This is the problem addressed in the present paper. A metric is defined in terms of a joint distribution on the product of the two sets, which has the two given distributions as its marginals, and has minimum entropy. Computing the metric exactly turns out to be NP-hard. Therefore an efficient greedy algorithm is presented for finding an upper bound on the distance.
Keywords
computational complexity; digital control; greedy algorithms; minimum entropy methods; set theory; statistical distributions; stochastic processes; Euclidean space; NP-hard metric; control input; control output; data compression; digital control; distinct set; finite alphabet; finite set; greedy algorithm; information theory; joint distribution; minimum entropy; probability distribution; set cardinality; stochastic process; Entropy; Joints; Measurement; Probability distribution; Random variables; Stochastic processes; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
Conference_Location
Orlando, FL
ISSN
0743-1546
Print_ISBN
978-1-61284-800-6
Electronic_ISBN
0743-1546
Type
conf
DOI
10.1109/CDC.2011.6160500
Filename
6160500
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