• DocumentCode
    3427909
  • Title

    An LWIR imaging system with low noise characteristic based on CMOS TDI detector

  • Author

    Xie, Baorong ; Zhao, Longcheng ; Fu, Yutian

  • Author_Institution
    Shanghai Inst. of Tech. Phys., CAS, Shanghai, China
  • fYear
    2010
  • fDate
    24-28 Oct. 2010
  • Firstpage
    413
  • Lastpage
    416
  • Abstract
    In the interest of expanding our observation of long wavelength spectral range based on space, we have designed and implemented a CMOS LWIR Imaging system by using time delay and integration (TDI) arrays with a 480 line of 6 stages. In the hardware design we pay much emphasis on how to reduce noise and improve signal to noise ratio (SNR) of infrared system. The software of host computer realizes non-uniformity correction of line-scan images. This paper presents each part of the system design in detail and preliminary results of tests and imaging. Experiments show that the long wavelength infrared CMOS TDI imaging system has a good performance in terms of SNR and images uniformity.
  • Keywords
    CMOS image sensors; delays; image processing; infrared imaging; CMOS TDI detector; LWIR imaging system; TDI arrays; infrared system; long wavelength spectral range; low noise characteristic; signal to noise ratio; time delay and integration arrays; CMOS integrated circuits; Converters; Detectors; Imaging; Noise; Pixel; Software; CMOS TDI; Imaging system; LWIR; NETD; non-uinfomity correction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing (ICSP), 2010 IEEE 10th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5897-4
  • Type

    conf

  • DOI
    10.1109/ICOSP.2010.5657159
  • Filename
    5657159