DocumentCode
3427909
Title
An LWIR imaging system with low noise characteristic based on CMOS TDI detector
Author
Xie, Baorong ; Zhao, Longcheng ; Fu, Yutian
Author_Institution
Shanghai Inst. of Tech. Phys., CAS, Shanghai, China
fYear
2010
fDate
24-28 Oct. 2010
Firstpage
413
Lastpage
416
Abstract
In the interest of expanding our observation of long wavelength spectral range based on space, we have designed and implemented a CMOS LWIR Imaging system by using time delay and integration (TDI) arrays with a 480 line of 6 stages. In the hardware design we pay much emphasis on how to reduce noise and improve signal to noise ratio (SNR) of infrared system. The software of host computer realizes non-uniformity correction of line-scan images. This paper presents each part of the system design in detail and preliminary results of tests and imaging. Experiments show that the long wavelength infrared CMOS TDI imaging system has a good performance in terms of SNR and images uniformity.
Keywords
CMOS image sensors; delays; image processing; infrared imaging; CMOS TDI detector; LWIR imaging system; TDI arrays; infrared system; long wavelength spectral range; low noise characteristic; signal to noise ratio; time delay and integration arrays; CMOS integrated circuits; Converters; Detectors; Imaging; Noise; Pixel; Software; CMOS TDI; Imaging system; LWIR; NETD; non-uinfomity correction;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing (ICSP), 2010 IEEE 10th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5897-4
Type
conf
DOI
10.1109/ICOSP.2010.5657159
Filename
5657159
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