DocumentCode :
3428184
Title :
SOI : Materials to Systems
Author :
Auberton-Herve, A.J.
Author_Institution :
SOITEC SA , Grenoble, France
fYear :
1996
fDate :
8-11 Dec. 1996
Firstpage :
929
Lastpage :
930
Abstract :
There is increased interest in the steam oxidation of AlxGat-xAs, following the pioneering work done at University of Illinoisl. We report the first demonstration of p-HEMTs in GaAs On Insulator (GOI) technology using Alz03 formed by the steam oxidation of AlAs as the buffer insulator. p-HEMT is one of the most widely used device in high speed applicatilons,including wireless communications. The GOI p-HEMT promises to be a high output resistance, high efficiency, high linearity device, attractive for high frequency communication applications.
Keywords :
Epitaxial layers; Gallium arsenide; Insulation; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-3393-4
Type :
conf
DOI :
10.1109/IEDM.1996.554131
Filename :
554131
Link To Document :
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