Title :
An Intercarrier Interference Cancellation Technique with SSC and ASIZ in OFDM Systems
Author :
Zhao, Li ; Li, Juan ; Tian, Kechun
Author_Institution :
Guilin Univ. of Electron. Technol., Guilin
Abstract :
For intercarrier interference (ICI) due to frequency offsets, an ICI cancellation scheme is proposed for combating the impact of ICI on OFDM systems in this paper. A received symbol shift cancellation (SSC) algorithm and an adjacent subchannel inserting zero (ASIZ) algorithm are designed for the ICI cancellation scheme, respectively. At the transmitter, original data symbols are mapped into one special symbol block by using ASIZ, and then it is transmitted as a regular OFDM system. At the receiver, Received signals are demodulated to obtain the data symbols as a regular OFDM system, and then these symbols are processed by using SSC. By doing so, the estimation of original data symbols is obtained, and meanwhile ICI is mitigated, finally. Simulation results show that the ICI contained in the received signals can be effectively reduced by using the ASIZ scheme, and the Signal-to-Interference power Ratio (SIR) of the scheme is obviously much better than that of a regular scheme. Similarly, bit error rate (BER) performance of the scheme is much better than that of others.
Keywords :
OFDM modulation; error statistics; intercarrier interference; interference suppression; ASIZ algorithm; BER performance; OFDM systems; SSC algorithm; adjacent subchannel inserting zero algorithm; bit error rate; data symbol estimation; intercarrier interference cancellation technique; orthogonal frequency division multiplexing; received symbol shift cancellation; signal-to-interference power ratio; Algorithm design and analysis; Bit error rate; Fading; Frequency diversity; Frequency estimation; Interference cancellation; OFDM; Signal processing; Transceivers; Transmitters;
Conference_Titel :
Wireless Communications, Networking and Mobile Computing, 2008. WiCOM '08. 4th International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-1-4244-2107-7
Electronic_ISBN :
978-1-4244-2108-4
DOI :
10.1109/WiCom.2008.194