DocumentCode
3428502
Title
Transient TAV And Capacitance Measurements For Surface Characterization In GaAs And Si
Author
Ostrovskii, I.V. ; Saiko, S.V.
Author_Institution
Univ. of Kiev
fYear
1994
fDate
17-23 May 1994
Keywords
Capacitance measurement; Electron traps; Gallium arsenide; Physics; Pulse measurements; Substrates; Surface acoustic waves; Time measurement; Ultrasonic variables measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Surface Waves in Solid and Layered Structures, 1994, and National Conference on Acoustoelectronics. 1994 International Symposium on. Program and Abstracts
Conference_Location
Moscow, Russia
Type
conf
DOI
10.1109/ISSWAS.1994.662522
Filename
662522
Link To Document