DocumentCode
3428643
Title
Two on-chip bandwidth calibration methods for phase-locked loops used in wireless transceiver applications
Author
Unterassinger, Hartwig ; Flatscher, Martin ; Gschier, Tony ; Jongsma, Jakob ; Pribyl, W.
Author_Institution
Inst. of Electron., Graz Univ. of Technol., Graz, Austria
fYear
2013
fDate
1-4 July 2013
Firstpage
1837
Lastpage
1843
Abstract
Phase-locked loops (PLL) are essential building blocks in wireless transceivers. Concerning data transmission and reception the performance of the PLL is crucial for the overall performance of the whole system. The transmitter architecture of the presented system does not use mixers but the PLL itself for FSK modulation. Therefore especially the bandwidth of the PLL influences performance parameters. As the PLL bandwidth is subject to significant variations due to process, temperature and supply voltage, bandwidth calibration is an important measure to ensure the PLL performance specifications. This paper presents two methods which use building blocks of an existing transceiver to calibrate the PLL bandwidth. Both methods use existing features of the transceiver architecture and therefore require only minimal adjustments and in principal no additional building blocks in order to accomplish bandwidth calibration. The first method uses an ADC to measure the PLL Loop Filter Voltage and the second employs the receiver to observe the frequency and phase of the PLL output signal. The proposed methods have been verified by measurements using a test chip implemented in a low-cost Infineon 130 nm CMOS process and an FPGA board. The variation of the PLL bandwidth after calibration is lower than ±10% compared to more than ±60% for an uncalibrated PLL. The time needed for calibration lies between 32 μs and 200 μs.
Keywords
CMOS integrated circuits; bandwidth allocation; field programmable gate arrays; frequency shift keying; phase locked loops; radio transceivers; ADC; CMOS process; FPGA board; FSK modulation; PLL bandwidth; PLL loop filter voltage; PLL output signal; data reception; data transmission; on-chip bandwidth calibration; phase-locked loops; size 130 nm; supply voltage; temperature; wireless transceiver; Bandwidth; Calibration; Frequency measurement; Frequency shift keying; Phase locked loops; Transceivers; Voltage measurement; Fractional-N PLL; bandwidth-calibration; transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
EUROCON, 2013 IEEE
Conference_Location
Zagreb
Print_ISBN
978-1-4673-2230-0
Type
conf
DOI
10.1109/EUROCON.2013.6625226
Filename
6625226
Link To Document