Title :
Discovery of the tri-edge inequality with binary vector dissimilarity measures
Author :
Zhang, Bin ; Srihari, Sargur
Author_Institution :
Dept. of Human Genetics, California Univ., Los Angeles, CA, USA
Abstract :
In certain spaces using some distance measures, the sum of any two distances is always bigger than the third one. Such a special property is called the tri-edge inequality (TEI). In this paper, the tri-edge inequality characterizing several binary distance measures is mathematically proven and experimentally verified, and the implications of TEI are discussed as well.
Keywords :
signal processing; vectors; binary vector dissimilarity measures; tri-edge inequality; Pattern recognition;
Conference_Titel :
Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
Print_ISBN :
0-7695-2128-2
DOI :
10.1109/ICPR.2004.1333861