Title :
Thermal aging effects on the electrical properties of film and ceramic capacitors
Author :
Overton, E. ; Hammoud, A.N. ; Baumann, E.D. ; Myers, I.T.
Author_Institution :
Nat. Aeronaut. & Space Admin. Lewis Res. Center, Cleveland, OH, USA
Abstract :
Experiments are carried out to evaluate film and ceramic capacitors for potential use in high temperature applications. The capacitors are characterized in terms of their capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz at temperatures of 20°C to 200°C. DC leakage current measurements are also obtained as a function of temperature. The effects of thermal stressing, in air and without electrical bias, on the properties of the capacitors are determined as a function of thermal aging up to 12 weeks. The results indicated that short-term aging has minimal influence on the dielectric properties of both the teflon and ceramic type capacitors
Keywords :
ceramic capacitors; 20 to 200 degC; 50 Hz to 100 kHz; DC leakage current measurements; capacitance stability; ceramic capacitors; dielectric loss; electrical properties; film capacitors; teflon capacitors; thermal stressing; Aging; Capacitance; Capacitors; Ceramics; Dielectric losses; Frequency; Leakage current; Stability; Temperature distribution; Thermal stresses;
Conference_Titel :
Electrical Electronics Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1993. Proceedings., Chicago '93 EEIC/ICWA Exposition
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-0847-6
DOI :
10.1109/EEIC.1993.631046
