Thermal aging effects on the electrical properties of film and ceramic capacitors

Author

Overton, E. ; Hammoud, A.N. ; Baumann, E.D. ; Myers, I.T.

Author_Institution

Nat. Aeronaut. & Space Admin. Lewis Res. Center, Cleveland, OH, USA

fYear

1993

fDate

4-7 Oct 1993

Firstpage

201

Lastpage

205

Abstract

Experiments are carried out to evaluate film and ceramic capacitors for potential use in high temperature applications. The capacitors are characterized in terms of their capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz at temperatures of 20°C to 200°C. DC leakage current measurements are also obtained as a function of temperature. The effects of thermal stressing, in air and without electrical bias, on the properties of the capacitors are determined as a function of thermal aging up to 12 weeks. The results indicated that short-term aging has minimal influence on the dielectric properties of both the teflon and ceramic type capacitors

Keywords

ceramic capacitors; 20 to 200 degC; 50 Hz to 100 kHz; DC leakage current measurements; capacitance stability; ceramic capacitors; dielectric loss; electrical properties; film capacitors; teflon capacitors; thermal stressing; Aging; Capacitance; Capacitors; Ceramics; Dielectric losses; Frequency; Leakage current; Stability; Temperature distribution; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Electronics Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1993. Proceedings., Chicago '93 EEIC/ICWA Exposition

Conference_Location

Chicago, IL

ISSN

1071-6270

Print_ISBN

0-7803-0847-6

Type

conf

DOI

10.1109/EEIC.1993.631046

Filename

631046