DocumentCode :
34290
Title :
Compact Model for Short-Channel Junctionless Accumulation Mode Double Gate MOSFETs
Author :
Holtij, Thomas ; Graef, Michael ; Hain, Franziska Marie ; Kloes, Alexander ; Iniguez, B.
Author_Institution :
Competence Center for Nanotechnol. & Photonics, Tech. Hochschule Mittelhessen, Giessen, Germany
Volume :
61
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
288
Lastpage :
299
Abstract :
A 2-D closed form, analytical compact model for long- and short-channel junctionless accumulation mode double gate MOSFETs is presented. The physics-based 2-D model for the potential is derived with the help of Poisson´s equation and the conformal mapping technique by Schwarz-Christoffel. From this closed-form solution, we derive simple equations for the calculation of the threshold voltage VT and subthreshold slope S. Using Lambert´s W-function and a smoothing function for the transition between the depletion and accumulation regions, a unified charge model valid for all operating regimes is developed. Dependencies between the physical device parameters and their impact on the device performance are worked out. A comparison of our 2-D physics-based compact model is done versus 2-D technology computer-aided design (TCAD) Sentaurus simulation data.
Keywords :
MOSFET; Poisson equation; conformal mapping; semiconductor device models; technology CAD (electronics); 2D closed form; 2D technology computer-aided design; Lamberts W-function; Poisson equation; Sentaurus simulation data; TCAD; analytical compact model; conformal mapping technique; double gate MOSFET; junctionless accumulation mode MOSFET; long channel JAM MOSFET; physical device parameter; short channel JAM MOSFET; smoothing function; threshold voltage; Boundary conditions; Electric potential; Equations; Logic gates; Mathematical model; Semiconductor device modeling; Silicon; 2-D analytical modeling; conformal mapping; drain-induced barrier lowering (DIBL); junctionless accumulation mode (JAM) MOSFET; physics-based compact model; subthreshold slope; threshold voltage; unified mobile charge density model;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2281615
Filename :
6616582
Link To Document :
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