DocumentCode :
3429051
Title :
A Multi-dimensional Hierarchal Engineering Competency Model Framework
Author :
Wells, Brian H.
Author_Institution :
Raytheon Co., Waltham, MA
fYear :
2008
fDate :
7-10 April 2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents a multi-dimensional hierarchal engineering competency model framework that can be used to create consistent, role-specific engineering competency models. The framework enables a process that organizes the creation of engineering competency models. The resulting competency models can be employed within a human resources (HR) talent management system. The framework can also be used by individuals to characterize their capabilities independent of a specific role. Individuals can use this characterization to compare their capabilities with many roles. Summing competencies of the individuals within an organization and comparing the result to an organizational competency model provides a means of examining the total capabilities of an organization and a means of identifying organizational capability gaps. The model framework was derived using a bottoms-up approach. All of the applicable knowledge, skills, behaviors and abilities are organized in a multi-dimensional and hierarchal manner. The multi-dimensional aspect allows organizations to add or subtract dimensions depending on the breadth of activities performed by the particular organization. The model framework is easy to use and to implement in a Web based computer program.
Keywords :
human resource management; organisational aspects; Web based computer program; human resources talent management system; multi-dimensional hierarchal engineering competency model; role-specific engineering competency models; Automotive engineering; Contracts; Finance; Financial management; Human resource management; Knowledge engineering; Organizational aspects; Software packages; Space vehicles; Testing; Competency Model; Framework; Human Resources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Conference, 2008 2nd Annual IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
978-1-4244-2149-7
Electronic_ISBN :
978-1-4244-2150-3
Type :
conf
DOI :
10.1109/SYSTEMS.2008.4518980
Filename :
4518980
Link To Document :
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