• DocumentCode
    3429146
  • Title

    Anodic bonding below 180°C for packaging and assembling of MEMS using lithium aluminosilicate-β-quartz glass-ceramic

  • Author

    Shoji, Shuichi ; Kikuchi, Hiroto ; Torigoe, Hirotaka

  • Author_Institution
    Dept. of Electron & Commun. Eng., Waseda Univ., Tokyo, Japan
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    482
  • Lastpage
    487
  • Abstract
    Silicon-to-glass anodic bonding is performed at temperature below 180°C using lithium aluminosilicate-β-quartz glass-ceramic. High alkaline ion mobility at low temperature which is required for bonding and thermal expansion coefficient matching to Si is realized by controlling the composition of the glass-ceramic. Bonding is obtained at the lowest temperature of 140°C. Useful bonding conditions are temperature above 160°C (applied voltage of above 500 V). Since the etch rate of the glass-ceramic is five times higher than that of Pyrex glass in HF wet etching and the undercut is very small with Cr-Au etch mask, three dimensional structures are easily fabricated. Low temperature anodic bonding using this type of glass-ceramic is useful for the packaging and assembling of MEMS
  • Keywords
    chromium alloys; elemental semiconductors; gold alloys; ion mobility; lithium compounds; microassembling; micromechanical devices; semiconductor device packaging; silicon; thermal expansion; 140 C; 180 C; 3D structures; 500 V; Cr-Au etch mask; CrAu; HF wet etching; Li aluminosilicate-β-quartz glass-ceramic; MEMS; Pyrex glass; alkaline ion mobility; anodic bonding; assembling; glass-ceramic seals; low temperature anodic bonding; matching; packaging; thermal expansion coefficient; Assembly; Bonding; Glass; Lithium; Micromechanical devices; Packaging; Temperature control; Thermal expansion; Voltage; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581907
  • Filename
    581907