Title :
Sacrificial aluminum etching for CMOS microstructures
Author :
Paul, O. ; Westberg, D. ; Hornung, M. ; Ziebart, V. ; Baltes, H.
Author_Institution :
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
This paper reports recent advances in surface micromachining by sacrificial aluminum etching (SALE). This method is applied to standard CMOS substrates in a single-mask, or even maskless, post-processing scheme. Underetching distances of several hundred microns are feasible. Design issues and technological steps such as protection of contact pads, etching, rinsing, and drying are discussed. The combination of SALE with other micromachining techniques, e.g., silicon bulk micromachining or material deposition is reported. New devices include thermal, capacitive, and mechanical structures for thermal microfluidics, the measurement of pressures and inertial forces, and the evaluation of mechanical thin film properties
Keywords :
CMOS integrated circuits; aluminium; etching; fluidics; force measurement; micromechanical devices; microsensors; pressure measurement; Al sacrificial etching; Al-Si; CMOS microstructures; CMOS substrates; Si; capacitive structures; contact pads; drying; etching; mechanical structures; mechanical thin film properties; rinsing; technological steps; thermal microfluidics; underetching; Aluminum; CMOS technology; Dry etching; Marketing and sales; Micromachining; Microstructure; Protection; Silicon; Substrates; Thermal force;
Conference_Titel :
Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-3744-1
DOI :
10.1109/MEMSYS.1997.581918