• DocumentCode
    3429357
  • Title

    Sacrificial aluminum etching for CMOS microstructures

  • Author

    Paul, O. ; Westberg, D. ; Hornung, M. ; Ziebart, V. ; Baltes, H.

  • Author_Institution
    Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    523
  • Lastpage
    528
  • Abstract
    This paper reports recent advances in surface micromachining by sacrificial aluminum etching (SALE). This method is applied to standard CMOS substrates in a single-mask, or even maskless, post-processing scheme. Underetching distances of several hundred microns are feasible. Design issues and technological steps such as protection of contact pads, etching, rinsing, and drying are discussed. The combination of SALE with other micromachining techniques, e.g., silicon bulk micromachining or material deposition is reported. New devices include thermal, capacitive, and mechanical structures for thermal microfluidics, the measurement of pressures and inertial forces, and the evaluation of mechanical thin film properties
  • Keywords
    CMOS integrated circuits; aluminium; etching; fluidics; force measurement; micromechanical devices; microsensors; pressure measurement; Al sacrificial etching; Al-Si; CMOS microstructures; CMOS substrates; Si; capacitive structures; contact pads; drying; etching; mechanical structures; mechanical thin film properties; rinsing; technological steps; thermal microfluidics; underetching; Aluminum; CMOS technology; Dry etching; Marketing and sales; Micromachining; Microstructure; Protection; Silicon; Substrates; Thermal force;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581918
  • Filename
    581918