Title :
Conducting diamond films in electrochemistry
Author_Institution :
Dept. of Chem., Michigan State Univ., East Lansing, MI, USA
Abstract :
Summary form only given. Electrically conductive diamond thin films show great promise as electrode materials, particularly in the field of electroanalysis. Some of the basic macroscopic electrochemical properties have been identified, but many aspects of the structure-reactivity relationship at the microscopic and nanoscopic levels is needed in order to understand what factors influence reactivity of these materials. We report herein on the basic electrochemical properties of boron-doped microcrystalline (nominal grain size of 1-5 /spl mu/m) and nitrogen-incorporated nanocrystalline (nominal grain size of 3-10 nm) diamond thin film electrodes, and how these electrodes are useful in electroanalysis. Characterization of these film electrodes by electrochemical methods of analysis, electrogenerated chemiluminescence imaging analysis (ECL) and Raman spectroscopy in the imaging mode is discussed. In addition to discussing the use of these materials in electroanalysis, the author also highlights efforts to fabricate (i) free-standing, optically transparent diamond electrodes for use in spectroelectrochemical measurements and (ii) electrocatalytic electrodes consisting of Pt nanoparticles incorporated into the diamond surface structure.
Keywords :
Raman spectra; boron; chemiluminescence; diamond; electrochemical electrodes; nanostructured materials; thin films; 1 to 5 micron; 3 to 10 nm; C-Pt; C:B; Pt nanoparticles; Raman spectroscopy; boron-doped microcrystalline diamond; characterization; conducting diamond films; diamond surface structure; electroanalysis; electrochemical methods; electrochemical properties; electrochemistry; electrogenerated chemiluminescence imaging analysis; nitrogen-incorporated nanocrystalline diamond; optically transparent diamond electrodes; spectroelectrochemical measurements; thin film electrodes; Conducting materials; Conductive films; Electrodes; Grain size; Image analysis; Microscopy; Optical films; Optical imaging; Raman scattering; Transistors;
Conference_Titel :
Wide Bandgap Layers, 2001. Abstract Book. 3rd International Conference on Novel Applications of
Conference_Location :
Zakopane, Poland
Print_ISBN :
0-7803-7136-4
DOI :
10.1109/WBL.2001.946552