Title :
1-D inverse problem solution for multilayered dielectric structure using K-signal conception
Author :
Drobakhin, Oleg ; Saltykov, Dmitriy
Author_Institution :
Dnepropetrovsk State Univ., Ukraine
Abstract :
1D inverse problem for multilayered dielectric structures is induced by different applications. The constancy of every layer parameters is given. This situation corresponds to the partial-constant profile of permittivity. The problem is to estimate values of dielectric constants and thickness of every layer simultaneously with only one-side access, thus only reflection coefficient (RC) information can be used
Keywords :
dielectric materials; electromagnetic wave reflection; inverse problems; least squares approximations; permittivity; 1D inverse problem; 1D inverse problem solution; EM wave reflection; K-signal conception; dielectric constants; every layer parameters; multilayered dielectric structure; multilayered dielectric structures; one-side access; partial-constant profile; permittivity; reflection coefficient; Dielectric constant; Frequency measurement; Inverse problems; Parameter estimation; Permittivity; Poles and zeros; Reflection; State estimation; Testing; Time domain analysis;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 1996., 6th International Conference on
Conference_Location :
Lviv
Print_ISBN :
0-7803-3291-1
DOI :
10.1109/MMET.1996.565752
