• DocumentCode
    3429841
  • Title

    In-situ Characterization Of Adsorbed Protein Films Using Surface Plasmon Resonance

  • Author

    Jorgenson, R.C. ; Yee, S.S. ; Chittur, K.K. ; Burgess, L.W.

  • Author_Institution
    University of Washington
  • fYear
    1990
  • fDate
    1-4 Nov 1990
  • Firstpage
    440
  • Lastpage
    442
  • Keywords
    Dielectric films; Dielectric thin films; Equations; Optical films; Optical reflection; Plasmons; Polymer films; Protein engineering; Refractive index; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE
  • Print_ISBN
    0-87942-559-8
  • Type

    conf

  • DOI
    10.1109/IEMBS.1990.691154
  • Filename
    691154