DocumentCode :
3429841
Title :
In-situ Characterization Of Adsorbed Protein Films Using Surface Plasmon Resonance
Author :
Jorgenson, R.C. ; Yee, S.S. ; Chittur, K.K. ; Burgess, L.W.
Author_Institution :
University of Washington
fYear :
1990
fDate :
1-4 Nov 1990
Firstpage :
440
Lastpage :
442
Keywords :
Dielectric films; Dielectric thin films; Equations; Optical films; Optical reflection; Plasmons; Polymer films; Protein engineering; Refractive index; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE
Print_ISBN :
0-87942-559-8
Type :
conf
DOI :
10.1109/IEMBS.1990.691154
Filename :
691154
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3429841
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