• DocumentCode
    3430095
  • Title

    Research on ERT system denoising technology excited by bi-directional pulse current

  • Author

    Pai, Wang ; Baolong, Guo ; Nan, Li

  • Author_Institution
    Inst. of Intell. Control & Image Eng., Xidian Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    1262
  • Lastpage
    1265
  • Abstract
    In order to improve denosing capacity of ERT system excited by bi-directional pulse current and reduce the disturbance on measurements caused by noises, this paper makes further studies on the noises caused by the charges accumulated on the measurement electrode. 2D emulation is established for 16 electrode sensitivity field and also parameter distribution model of the ERT sensitivity field under the adjacent models. Thus, a detailed analysis is carried out on the generation of the noise and the influence on the measurements. On basis of it, we put forward a high-speed discharge circuit based on Schottky diodes. This circuit is characterized in quick discharge, adjustable interface threshold and automatically-determined polarity of the charge, etc. At the end of this paper, the emulation results of the circuit is given out, which is verified that the circuit can effectively suppress the noises generated by the charges accumulated on the measurement electrode.
  • Keywords
    Schottky diodes; discharges (electric); electric charge; electric impedance imaging; electrodes; signal denoising; signal processing equipment; 2D emulation; ERT system denoising technology; Schottky diodes; bidirectional pulse current; electrical resistance tomography; electrode sensitivity field; high speed discharge circuit; measurement electrode; Bidirectional control; Circuit noise; Current measurement; Electrodes; Emulation; Noise generators; Noise measurement; Noise reduction; Pulse measurements; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Automation, 2009. ICCA 2009. IEEE International Conference on
  • Conference_Location
    Christchurch
  • Print_ISBN
    978-1-4244-4706-0
  • Electronic_ISBN
    978-1-4244-4707-7
  • Type

    conf

  • DOI
    10.1109/ICCA.2009.5410488
  • Filename
    5410488