• DocumentCode
    3430145
  • Title

    Error reduction for the high-contrast regions in phase measuring profilometry

  • Author

    Xiaochang Xu ; Yongchang Wang ; Kai Liu

  • Author_Institution
    Sch. Of Electr. Eng. & Inf., Sichuan Univ., Chengdu, China
  • fYear
    2013
  • fDate
    6-10 July 2013
  • Firstpage
    72
  • Lastpage
    76
  • Abstract
    Phase measuring profilometry is a method for measuring the 3D profile of objects. The method is known for its accuracy and high speed. In real world applications, however, the 3D reconstructions of the high-contrast regions have large measurement errors due to the smoothing effect by digital cameras. In this paper, we model the smoothing as a mathematical smooth mask applying process. Accordingly, we propose a novel de-convolution method specified for recovering the phase in the high-contrast regions. The experimental results demonstrate that, compared with the traditional method, the new method improves the measurement accuracy by 2.5 times in the high-contrast regions.
  • Keywords
    cameras; deconvolution; image reconstruction; measurement errors; 3D image reconstructions; 3D profile measurement; deconvolution method; digital cameras; error reduction; high-contrast regions; mathematical smooth mask process; measurement errors; phase measuring profilometry; Cameras; Convolution; Integrated circuits; Measurement uncertainty; Phase measurement; Smoothing methods; Three-dimensional displays; Phase measuring profilometry; de-convolution method; high-contrast; phase error; sobel operator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Information Processing (ChinaSIP), 2013 IEEE China Summit & International Conference on
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/ChinaSIP.2013.6625300
  • Filename
    6625300