DocumentCode :
3430145
Title :
Error reduction for the high-contrast regions in phase measuring profilometry
Author :
Xiaochang Xu ; Yongchang Wang ; Kai Liu
Author_Institution :
Sch. Of Electr. Eng. & Inf., Sichuan Univ., Chengdu, China
fYear :
2013
fDate :
6-10 July 2013
Firstpage :
72
Lastpage :
76
Abstract :
Phase measuring profilometry is a method for measuring the 3D profile of objects. The method is known for its accuracy and high speed. In real world applications, however, the 3D reconstructions of the high-contrast regions have large measurement errors due to the smoothing effect by digital cameras. In this paper, we model the smoothing as a mathematical smooth mask applying process. Accordingly, we propose a novel de-convolution method specified for recovering the phase in the high-contrast regions. The experimental results demonstrate that, compared with the traditional method, the new method improves the measurement accuracy by 2.5 times in the high-contrast regions.
Keywords :
cameras; deconvolution; image reconstruction; measurement errors; 3D image reconstructions; 3D profile measurement; deconvolution method; digital cameras; error reduction; high-contrast regions; mathematical smooth mask process; measurement errors; phase measuring profilometry; Cameras; Convolution; Integrated circuits; Measurement uncertainty; Phase measurement; Smoothing methods; Three-dimensional displays; Phase measuring profilometry; de-convolution method; high-contrast; phase error; sobel operator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Information Processing (ChinaSIP), 2013 IEEE China Summit & International Conference on
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/ChinaSIP.2013.6625300
Filename :
6625300
Link To Document :
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