Title :
Internal feedback bridging faults in combinational CMOS circuits: analysis and testing
Author :
Nliura, Y. ; Sen, Shuichi
Author_Institution :
Tokyo Metropolitan University
fDate :
May 29 2001-June 1 2001
Abstract :
We analyze fault behaviors of intemal feedback bridging faults by using a simple circuit model consisting of 2-input NAND gate and NOT gate. From analysis results we find that they are more complex than those associated with extemal feedback bridging faults. We expose that they cause intemal oscillation and IDDQ-only failure as well as latch and oscillation behavior. We also discuss methods for detecting this kind of fault.
Keywords :
Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Electronic mail; Fault detection; Feedback circuits; Integrated circuit interconnections; Semiconductor device modeling; Very large scale integration;
Conference_Titel :
Test Workshop, 2001. IEEE European
Conference_Location :
Stockholm, Sweden
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946655
