• DocumentCode
    3430588
  • Title

    Internal feedback bridging faults in combinational CMOS circuits: analysis and testing

  • Author

    Nliura, Y. ; Sen, Shuichi

  • Author_Institution
    Tokyo Metropolitan University
  • fYear
    2001
  • fDate
    May 29 2001-June 1 2001
  • Firstpage
    9
  • Lastpage
    16
  • Abstract
    We analyze fault behaviors of intemal feedback bridging faults by using a simple circuit model consisting of 2-input NAND gate and NOT gate. From analysis results we find that they are more complex than those associated with extemal feedback bridging faults. We expose that they cause intemal oscillation and IDDQ-only failure as well as latch and oscillation behavior. We also discuss methods for detecting this kind of fault.
  • Keywords
    Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Electronic mail; Fault detection; Feedback circuits; Integrated circuit interconnections; Semiconductor device modeling; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop, 2001. IEEE European
  • Conference_Location
    Stockholm, Sweden
  • ISSN
    1530-1877
  • Print_ISBN
    0-7695-1017-5
  • Type

    conf

  • DOI
    10.1109/ETW.2001.946655
  • Filename
    946655
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3430588