DocumentCode
3430864
Title
On hardware generation of random single input change test sequences
Author
David, R. ; Girard, P. ; Landrault, C. ; Pravossoudovitch, S. ; Virazel, A.
Author_Institution
(INPG- CNRS- UJF)
fYear
2001
fDate
2001
Firstpage
117
Lastpage
123
Keywords
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay effects; Hardware; Microwave integrated circuits; Robustness; Silicon carbide; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 2001. IEEE European
ISSN
1530-1877
Print_ISBN
0-7695-1017-5
Type
conf
DOI
10.1109/ETW.2001.946674
Filename
946674
Link To Document