DocumentCode
3430987
Title
A novel NMF-based image quality assessment metric using extreme learning machine
Author
Shuigen Wang ; Chenwei Deng ; Weisi Lin ; Guang-Bin Huang
Author_Institution
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
fYear
2013
fDate
6-10 July 2013
Firstpage
255
Lastpage
258
Abstract
In this paper, we propose a novel image quality assessment (IQA) metric based on nonnegative matrix factorization (NM-F). With nonnegativity and parts-based properties, NMF well demonstrates how human brain learns the parts of objects. This makes NMF distinguished from other feature extraction methods like singular value decomposition (SVD), principal components analysis (PCA), etc. Inspired by this, we adopt NMF to extract image features from reference and distorted images. Extreme learning machine (ELM) [10] is then employed for feature pooling to obtain the overall quality score. Compared with other machine learning techniques such as neural networks and support vector machines (SVMs), ELM provides better generalization performance with much faster learning speed and less human intervene. Experimental results with the TID database demonstrate that the proposed metric achieves better performance in comparison with the relevant state-of-the-art quality metrics and has lower computational complexity.
Keywords
computational complexity; feature extraction; generalisation (artificial intelligence); image processing; learning (artificial intelligence); matrix decomposition; NMF; TID database; computational complexity; distorted images; extreme learning machine; feature pooling; generalization performance; image feature extraction; image quality assessment metric; nonnegative matrix factorization; nonnegativity properties; parts-based properties; Computational complexity; Feature extraction; Image quality; Measurement; Neurons; Noise; Vectors; Extreme Learning Machine; Image Quality Assessment; Nonnegative Matrix Factorization;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal and Information Processing (ChinaSIP), 2013 IEEE China Summit & International Conference on
Conference_Location
Beijing
Type
conf
DOI
10.1109/ChinaSIP.2013.6625339
Filename
6625339
Link To Document