• DocumentCode
    3431033
  • Title

    Author listing

  • fYear
    2003
  • fDate
    20-20 March 2003
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2003. International Conference on
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-7653-6
  • Type

    conf

  • DOI
    10.1109/ICMTS.2003.1197359
  • Filename
    1197359