Title :
A method for bipolar semiconductor device modeling implementable in circuit simulators
Author :
Araujo, Armando ; Carvalho, Adriano ; De Carvalho, J. L Martins
Author_Institution :
FEUP DEEC ISR, Porto, Portugal
Abstract :
This paper presents a method for modeling power semiconductor devices based on the unidimensional solution of the diffusion equation describing the behavior of charge in low doped zones. The method uses a variational approach, and the finite elements method, which allows one to transform a partial differential equation in space and time into a finite set of differential equations in time only. As the used functional is quadratic the matrices associated with this set of differential equations are tridiagonal and symmetric which enables a network analogy and the solution to be tried oriented to circuit simulator. This electrical network model is then linked with other circuits, modeling the remaining zones of the device, in order to make a circuit representation of the same one. Modular models for the circuit simulation of generic p-i-n diodes and bipolar junction transistors are presented as well as some simulation results
Keywords :
circuit simulation; finite element analysis; p-i-n diodes; partial differential equations; power bipolar transistors; power semiconductor diodes; semiconductor device models; variational techniques; bipolar semiconductor device; charge behavior; circuit simulators; diffusion equation; electrical network model; finite element method; generic p-i-n diodes; network analogy; partial differential equation; power semiconductor devices; semiconductor device modeling; unidimensional solution; variational approach; Bipolar transistor circuits; Circuit simulation; Differential equations; Finite element methods; P-i-n diodes; Partial differential equations; Power semiconductor devices; Semiconductor device modeling; Symmetric matrices; Transforms;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.813371