• DocumentCode
    3431099
  • Title

    A new approach for the extraction of SPICE MOSFET Level-3 static model parameters

  • Author

    Yazgi, Metin ; Kuntman, Hakan

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Turkey
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    505
  • Abstract
    An iteration procedure obtained by using a new approach is presented for the extraction of SPICE Level-3 MOS Transistor static model parameters KP, VTH, θ, VMAX and Rs(=RD). The procedure uses both gate and drain characteristics or one of these in the triode region of operation. As well as the triode region parameters, NFS and χ can be found in the overall procedure. Results of the procedure have been compared with the experimental results. It is obvious from this comparison that the new approach is effective for determination of Level-3 model parameters. In addition to that, it is possible to use this new approach for other models which can be represented by polynomial equations in which the parameters are coefficients as in eqn (2)
  • Keywords
    MOSFET; SPICE; circuit simulation; inversion layers; iterative methods; semiconductor device models; Level-3 static model parameters; MOSFET; SPICE; drain characteristics; gate characteristics; iteration procedure; polynomial equations; triode region; Data mining; Electronic mail; Equations; Intrusion detection; MOSFET circuits; SPICE; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 1998 IEEE International Conference on
  • Conference_Location
    Lisboa
  • Print_ISBN
    0-7803-5008-1
  • Type

    conf

  • DOI
    10.1109/ICECS.1998.813372
  • Filename
    813372