DocumentCode :
3431099
Title :
A new approach for the extraction of SPICE MOSFET Level-3 static model parameters
Author :
Yazgi, Metin ; Kuntman, Hakan
Author_Institution :
Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Turkey
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
505
Abstract :
An iteration procedure obtained by using a new approach is presented for the extraction of SPICE Level-3 MOS Transistor static model parameters KP, VTH, θ, VMAX and Rs(=RD). The procedure uses both gate and drain characteristics or one of these in the triode region of operation. As well as the triode region parameters, NFS and χ can be found in the overall procedure. Results of the procedure have been compared with the experimental results. It is obvious from this comparison that the new approach is effective for determination of Level-3 model parameters. In addition to that, it is possible to use this new approach for other models which can be represented by polynomial equations in which the parameters are coefficients as in eqn (2)
Keywords :
MOSFET; SPICE; circuit simulation; inversion layers; iterative methods; semiconductor device models; Level-3 static model parameters; MOSFET; SPICE; drain characteristics; gate characteristics; iteration procedure; polynomial equations; triode region; Data mining; Electronic mail; Equations; Intrusion detection; MOSFET circuits; SPICE; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
Type :
conf
DOI :
10.1109/ICECS.1998.813372
Filename :
813372
Link To Document :
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