• DocumentCode
    3431193
  • Title

    Immunity model study on irradiation effect of Electrostatic electromagnetic pulses

  • Author

    Liu Jin ; Tan Zhi-liang ; Ni Lei

  • Author_Institution
    Inst. of Electrostatic & Electromagn. Protection, Ordnance Eng. Coll., Shijiazhuang, China
  • Volume
    5
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Abstract
    The energy coupling mechanism of transmission line under external electromagnetic field was researched, and mathematical model was established. According to IEC61000-4-2 standard, Electrostatic discharge immunity test was done; electric field strength around the coupling plates was also measured. The experimental results indicated that the thresholds of electrostatic discharge which made EUT damaged were different, and the HCP mode was more harmful to EUT. Magnitude of induction voltage cased by HCP was greater than the value cased by VCP, while the strength of radiative field was almost equal in the two modes. The analysis of mathematical model is accordant with the experimental result. As a result, the model is valid and is considered a promising approach to study the immunity of electronic system against ESD EMP coupling effect.
  • Keywords
    IEC standards; immunity testing; radiation effects; transmission lines; ESD EMP coupling effect; IEC61000-4-2 standard; coupling plates; electric field strength measurement; electrostatic discharge immunity test; electrostatic electromagnetic pulses; energy coupling mechanism; external electromagnetic field; immunity model study; irradiation effect; mathematical model; transmission line; EMP radiation effects; Electromagnetic coupling; Electromagnetic fields; Electromagnetic modeling; Electrostatic discharge; Electrostatic measurements; Immunity testing; Mathematical model; Measurement standards; Transmission line measurements; ESD EMP; immunity; irradiation effect; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design and Applications (ICCDA), 2010 International Conference on
  • Conference_Location
    Qinhuangdao
  • Print_ISBN
    978-1-4244-7164-5
  • Electronic_ISBN
    978-1-4244-7164-5
  • Type

    conf

  • DOI
    10.1109/ICCDA.2010.5541460
  • Filename
    5541460