Title :
Content addressable memory for flash redundancy
Author :
Jex, Jerry ; Baker, Alan
Author_Institution :
Intel Corp., Folsom, CA, USA
Abstract :
The authors describe content addressable memory (CAM) used on a 1-Mb flash memory. Yield is improved by replacing defective columns containing fatal random defects. The CAM provides the address of a redundant column as an output needed to implement column redundancy. Novel placement of the CAM can decrease redundant CAM area, decreases the total chip area, and increases the redundancy efficiency
Keywords :
content-addressable storage; chip area; content addressable memory; fatal random defects; flash redundancy; redundancy efficiency; redundant column; Associative memory; CADCAM; Cities and towns; Computer aided manufacturing; Costs; Fabrication; Flash memory; Information geometry; Integrated circuit yield; Process design;
Conference_Titel :
Communications, Computers and Signal Processing, 1991., IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-87942-638-1
DOI :
10.1109/PACRIM.1991.160846
