Title :
Project management system re-engineeringfor asic wafer-based business in idm facility
Author :
Chang, Su-min ; Lin, Chao-yi ; Chuang, Robin ; Luo, Chun-jih
Keywords :
Application specific integrated circuits; Chaos; Logistics; Manufacturing; Production; Project management; Testing;
Conference_Titel :
Semiconductor Manufacturing Technology Workshop, 2002
Print_ISBN :
0-7803-7604-8
DOI :
10.1109/SMTW.2002.1197367
