Title :
Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs
Author :
Chan, Y.C. ; Wang, Y. ; Gui, Z.L. ; Li, L.T.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Hong Kong
Abstract :
The effects of different thermal shock treatments on dielectric and electrical properties of relaxor based and BaTiO3 based “0805” Y5V multilayer ceramic chip capacitors (MLCs) were investigated. It was found that thermal shock generally resulted in larger leakage currents and lower breakdown voltages. It is also confirmed that the thermal shock resistance of relaxer MLCs is in disadvantage to that of the barium titanate MLCs. Nevertheless, no obvious failure was found when the relaxor-based MLCs were subjected to the thermal effects in the normal infrared solder reflow process. Besides the relatively lower mechanical strength, low insulation resistivity and breakdown strength were also proposed to be important contributors to the undesirable reliability of relaxor MLCs
Keywords :
ceramic capacitors; ferroelectric capacitors; ferroelectric devices; thermal shock; 805 Y5V multilayer ceramic chip capacitor; BaTiO3; MLC; barium titanate; breakdown strength; dielectric properties; electrical properties; failure; infrared solder reflow; insulation resistivity; leakage current; mechanical strength; relaxor ferroelectric ceramic; reliability; thermal shock; Barium; Capacitors; Ceramics; Dielectrics; Electric resistance; Electric shock; Leakage current; Nonhomogeneous media; Thermal resistance; Titanium compounds;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
Conference_Location :
Omiya
Print_ISBN :
0-7803-3622-4
DOI :
10.1109/IEMT.1995.541055
