DocumentCode :
3431557
Title :
Scaling, Power and the Future of CMOS
Author :
Horowitz, Mark
Author_Institution :
Comput. Syst. Lab., Stanford Univ., Stanford, CA
fYear :
2007
fDate :
6-10 Jan. 2007
Firstpage :
23
Lastpage :
23
Abstract :
In the mid 1980\´s the power growth that accompanied scaling forced the industry to focus on CMOS technology, and leave nMOS and bipolars for niche applications. Now 20 years later, CMOS technology is facing power issues of its own. After first reviewing the "cause" of the problem, it will become clear that there are not easy solutions this time - no new technology or simple system/circuit change will rescue us. Power, and not number of devices is now the primary limiter of chip performance, and the need to create power efficient designs is changing how we do design. This talk will review power optimized design methods and shows how power is strongly tied to performance and that variability aversely effects power efficiency. Projecting forward, it shows that unless die size shrinks, in future technologies most of the devices will need to be idle most of the time which has strong ramifications for the both the underlying device and system design.
Keywords :
CMOS integrated circuits; integrated circuit design; power semiconductor devices; CMOS technology; bipolars technology; chip performance; nMOS technology; power optimized design methods; system design; Application software; CMOS technology; Computer industry; Design methodology; Design optimization; Digital integrated circuits; MOS devices; Process design; Random access memory; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.140
Filename :
4092012
Link To Document :
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