Title :
Analog VLSI parameter fault diagnosis via neural network
Author :
Junren, Gan ; Bijuan, Wang ; Linshen, Yao
Author_Institution :
Inst. of Metall., Acad. Sinica, Beijing, China
Abstract :
A new method for analog integrated circuit fault parameter diagnosis is presented in this paper. It is based on neural network theory and has several advantages over normal methods. The method is applied to several examples and it works very well
Keywords :
analogue integrated circuits; backpropagation; circuit simulation; fault simulation; integrated circuit modelling; neural nets; ANN model; analog VLSI; backpropagation; fault parameter diagnosis; hidden layer nodes; neural network theory; simulation-before testing model; Analog circuits; Analog integrated circuits; Artificial neural networks; Circuit faults; Circuit simulation; Circuit testing; Differential equations; Fault diagnosis; Neural networks; Very large scale integration;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785901
