• DocumentCode
    343190
  • Title

    Wafer bonding and smartcut for formation of silicon-on-insulator materials

  • Author

    Bengtsson, Stefan

  • Author_Institution
    Solid State Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    745
  • Lastpage
    748
  • Abstract
    Silicon-on-insulator (SOI) materials are expected to get increased attention for mainstream CMOS as well as for high frequency or high voltage applications. Of the existing methods for manufacture of SOI materials, wafer bonding combined with smartcut seems to be the most promising approach. In the case of wafer bonding, surface micro-roughness, wafer dimensions, surface chemistry and ambient pressure all influence the result. In the smartcut technology, hydrogen implantation and an annealing step can be controlled for a precise splitting of a silicon wafer, thereby forming a thin silicon film. In this presentation the application of wafer bonding and smartcut for formation of SOI materials is reviewed
  • Keywords
    annealing; ion implantation; reviews; silicon-on-insulator; surface chemistry; surface topography; wafer bonding; CMOS applications; SOI; Si-SiO2; ambient pressure; annealing step; high frequency applications; high voltage applications; hydrogen implantation; review; silicon-on-insulator materials; smartcut; surface chemistry; surface micro-roughness; wafer bonding; wafer dimensions; Annealing; Chemical technology; Chemistry; Frequency; Hydrogen; Manufacturing; Semiconductor films; Silicon on insulator technology; Voltage; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.786103
  • Filename
    786103