Utilizing multiple UIO sequences and segment overlap to shorten test sequences

This paper presents two new approaches for communication protocols modeled as Finite State Machines. Two of the most important factors for shortening test sequences, viz, multiple unique I/O sequences and segment overlap, are used . The first approach does not verify the uniqueness of UIO sequences of states, but the second approach does. Miller and Paul´s (1991) approach derives the shortest test sequences for most instances. The two new approaches can outperform it in two ways: wider applicability and better fault coverage