Title : 
Electro-optic intensity modulator using higher-order resonant electrode with polarization-reversed structure
         
        
            Author : 
Enokihara, Akira ; Yajima, Hiroyoshi ; Murata, Hiroshi ; Okamura, Yasuyuki
         
        
            Author_Institution : 
Adv. Technol. Res. Labs., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
         
        
        
        
        
            Abstract : 
A novel structure of the electro-optic intensity modulator designed with a higher-order resonant electrode and the polarization-reversed structure is proposed. The light-modulation degradation caused by the optical transit-time effect in the electro-optic (EO) modulation area is eliminated by this scheme so that the modulation-efficiency is significantly enhanced. The modulator for 26 GHz operation was fabricated with a LiTaO3 substrate. The modulation electrode consisted of resonant coupled-microstrip-lines and the length was set at 9.03 mm, around seven times as long as a half-wavelength, to excite the seventh order harmonic resonance by the 26 GHz RF signal. The workability of the modulator was confirmed by the experiment using 1.3 μm wavelength light.
         
        
            Keywords : 
Mach-Zehnder interferometers; electro-optical modulation; intensity modulation; lithium compounds; microstrip lines; optical waveguides; tantalum compounds; transit time devices; 1.3 micron; 26 GHz; 9.03 mm; electrooptic intensity modulator; higher-order resonant electrode; light modulation degradation; microstrip lines; optical transit-time effect; polarization-reversed structure; seventh order harmonic resonance; Electrodes; Electrooptic modulators; Electrooptical waveguides; Intensity modulation; Millimeter wave technology; Optical modulation; Optical polarization; Optical resonators; Optical waveguides; Resonance;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2005 European
         
        
            Print_ISBN : 
2-9600551-2-8
         
        
        
            DOI : 
10.1109/EUMC.2005.1608792